The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2017
Filed:
May. 27, 2014
Applicant:
Haechitech Corporation, Cheongju-si, KR;
Inventors:
Ki-bog Youm, Cheongju-si, KR;
Young-bae Choi, Cheongju-si, KR;
Young-sug Seong, Cheongju-si, KR;
Kyung-seok Jin, Seoul, KR;
Assignee:
HAECHITECH CORPORATION, Cheongju-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 35/00 (2006.01);
U.S. Cl.
CPC ...
G01R 35/00 (2013.01);
Abstract
Provided are a magnetic sensor test apparatus and a magnetic sensor test method. The magnetic sensor test apparatus includes a vertical coil and at least one periphery coil disposed peripherally about the vertical coil. Both the vertical coil and the periphery coil may be configured to generate a horizontal and/or a vertical magnetic field in a semiconductor wafer.