Nanchang, China

Youlong Yuan

This inventor holds 1 USPTO granted patent. Top assignee: Nanchang University. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Youlong Yuan. Retrieved from https://idiyas.com/inventor/youlong-yuan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 13.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Innovations in Plasma Diagnostics by Youlong Yuan

Introduction

Youlong Yuan is a notable inventor based in Nanchang, China. He has made significant contributions to the field of plasma diagnostics through his innovative methods. His work focuses on enhancing the accuracy of measurements related to plasma parameters.

Latest Patents

Youlong Yuan holds a patent titled "Method for measuring electron nonextensive parameter of plasma using nonextensive statistical mechanics." This method utilizes nonextensive statistical mechanics and an electric probe to measure the electron nonextensive parameter of plasma. The approach allows for more accurate measurements of electron temperature, plasma potential, electron density, and floating potential compared to traditional single probes. The nonextensive electric probe plays a crucial role in plasma diagnosis, improving the diagnostic accuracy of various plasma parameters.

Career Highlights

Youlong Yuan is affiliated with Nanchang University, where he continues to advance research in plasma physics. His innovative methods have garnered attention in the scientific community, contributing to the understanding of plasma behavior and properties.

Collaborations

Youlong Yuan has collaborated with notable colleagues, including Huibin Qiu and Donghua Xiao. Their joint efforts have furthered research in the field and enhanced the impact of their findings.

Conclusion

Youlong Yuan's contributions to plasma diagnostics through his patented methods demonstrate the importance of innovation in scientific research. His work not only advances theoretical understanding but also improves practical applications in plasma measurement.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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