The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2024
Filed:
Dec. 17, 2021
Nanchang University, Nanchang, CN;
Huibin Qiu, Nanchang, CN;
Donghua Xiao, Nanchang, CN;
Xingkun Peng, Nanchang, CN;
Yuqing Zhu, Nanchang, CN;
Xianyang Zhang, Nanchang, CN;
Youlong Yuan, Nanchang, CN;
Qilong Cai, Nanchang, CN;
Tianyi Hu, Nanchang, CN;
Yue Gao, Nanchang, CN;
Zhiyi Ming, Nanchang, CN;
Jinmao Zhou, Nanchang, CN;
Zhenyu Zhou, Nanchang, CN;
Sanqiu Liu, Nanchang, CN;
NANCHANG UNIVERSITY, Nanchang, CN;
Abstract
A method for measuring an electron nonextensive parameter of a plasma by using nonextensive statistical mechanics and electric probe is provided. The plasma is described by the nonextensive statistical mechanics and establishes a nonextensive single electric probe theory on the basis of this. The electron nonextensive parameter have been measured which cannot be measured by traditional single probe, and obtained more accurate electron temperature, plasma potential, electron density and floating potential than traditional single probe. The nonextensive electric probe plays a role in plasma diagnosis, which will measure the nonextensivity of plasma and improve the diagnostic accuracy of other plasma parameters.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile