This inventor holds 1 USPTO granted patent. Top assignee: Nanchang University. Active years: 2024.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2024
Title: The Innovative Contributions of Xianyang Zhang
Introduction
Xianyang Zhang is a prominent inventor based in Nanchang, China. He has made significant contributions to the field of plasma diagnostics through his innovative research and patented methods. His work focuses on enhancing the accuracy of plasma parameter measurements, which is crucial for various scientific and industrial applications.
Latest Patents
Xianyang Zhang holds a patent titled "Method for measuring electron nonextensive parameter of plasma using nonextensive statistical mechanics." This method provides a novel approach to measuring the electron nonextensive parameter of plasma by utilizing nonextensive statistical mechanics and an electric probe. The traditional single probe methods often fall short in accuracy, but Zhang's approach allows for more precise measurements of electron temperature, plasma potential, electron density, and floating potential. The nonextensive electric probe he developed plays a vital role in plasma diagnosis, significantly improving the diagnostic accuracy of plasma parameters.
Career Highlights
Zhang is affiliated with Nanchang University, where he continues to advance his research in plasma physics. His work has garnered attention for its innovative approach and practical applications in the field. With a focus on nonextensive statistical mechanics, Zhang's research contributes to a deeper understanding of plasma behavior and its properties.
Collaborations
Xianyang Zhang has collaborated with notable colleagues, including Huibin Qiu and Donghua Xiao. These collaborations have further enriched his research and expanded the impact of his work in the scientific community.
Conclusion
Xianyang Zhang's contributions to plasma diagnostics through his patented methods exemplify the importance of innovation in scientific research. His work not only enhances measurement accuracy but also paves the way for future advancements in the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile