Gueishan, Taiwan

You-Hong Huang

This inventor holds 1 USPTO granted patent. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: You-Hong Huang. Retrieved from https://idiyas.com/inventor/you-hong-huang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: You-Hong Huang: Innovator in Defect Management Systems

Introduction

You-Hong Huang is a notable inventor based in Guishan, Taiwan. He has made significant contributions to the field of defect management systems, showcasing his expertise through his innovative patent.

Latest Patents

Huang holds a patent for "Defect management systems and methods." This patent describes a system for managing defects on an object, which includes an automatic defect classification (ADC) module, a lithographic plane review (LPR) module, and a defect progression monitor (DPM) module. The DPM module is designed to obtain information regarding a defect from both the ADC and LPR modules, determining whether repair or cleaning of the object is necessary. He has 1 patent to his name.

Career Highlights

You-Hong Huang is currently employed at Taiwan Semiconductor Manufacturing Company Ltd. His work focuses on enhancing the efficiency and effectiveness of defect management in semiconductor manufacturing processes.

Collaborations

Huang collaborates with talented individuals such as Yan-Wei Tien and Pei-Yi Su, contributing to advancements in their field.

Conclusion

You-Hong Huang's innovative work in defect management systems highlights his role as a key inventor in the semiconductor industry. His contributions continue to influence the effectiveness of defect management processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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