Rehovot, Israel

Yosi Bar On

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Nova Corporation. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yosi Bar On. Retrieved from https://idiyas.com/inventor/yosi-bar-on

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2024

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Yosi Bar On: Innovator in Integrated Measurement Systems

Introduction

Yosi Bar On is a notable inventor based in Rehovot, Israel. He has made significant contributions to the field of optical measurements through his innovative patent. His work focuses on enhancing measurement systems that integrate seamlessly with processing equipment.

Latest Patents

Yosi Bar On holds a patent for an Integrated Measurement System. This system is designed for applying optical measurements to various structures. It features a support assembly that allows for rotation and lateral movement, an advanced optical system with multiple lens units, and an optical window arrangement that facilitates the propagation of light for accurate measurements.

Career Highlights

Yosi Bar On is associated with Nova Corporation, where he applies his expertise in developing cutting-edge measurement technologies. His work has positioned him as a key player in the field of optical measurement systems.

Collaborations

Yosi collaborates with talented individuals such as Elad Dotan and Moshe Vanhotsker. Their combined efforts contribute to the advancement of innovative solutions in measurement technology.

Conclusion

Yosi Bar On's contributions to integrated measurement systems exemplify the impact of innovation in optical technologies. His patent reflects a commitment to enhancing measurement accuracy and efficiency in various applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…