Yokohama, Japan

Yoshiyuki Tohge

This inventor holds 1 USPTO granted patent. Top assignee: Canon Kabushiki Kaisha. Active years: 1993.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshiyuki Tohge. Retrieved from https://idiyas.com/inventor/yoshiyuki-tohge

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 34(Granted Patents)


Company Filing History:


Years Active: 1993

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1 patent (USPTO):Explore Patents

Title: Innovations of Yoshiyuki Tohge

Introduction

Yoshiyuki Tohge is a notable inventor based in Yokohama, Japan. He has made significant contributions to the field of particle analysis through his innovative inventions. His work is particularly recognized for its practical applications in various scientific and industrial settings.

Latest Patents

Tohge holds a patent for a "Particle analyzing apparatus having pressure control system." This invention features a sample liquid pressurizing means that pressurizes sample liquid containing particles for examination. It also includes sheath liquid pressurizing means that surround the sample liquid, ensuring accurate analysis. The apparatus is equipped with a pressure sensor to maintain a constant output, along with means for applying light to the examined portion and photometering the emitted light from the particles. This technology enhances the efficiency and accuracy of particle analysis.

Career Highlights

Yoshiyuki Tohge is associated with Canon Kabushiki Kaisha, a leading company in imaging and optical products. His role at Canon has allowed him to develop and refine his inventions, contributing to the company's reputation for innovation in technology.

Collaborations

Tohge has collaborated with Naoki Yuguchi, working together to advance their research and development efforts in particle analysis technologies.

Conclusion

Yoshiyuki Tohge's contributions to the field of particle analysis through his innovative patent demonstrate his expertise and commitment to advancing technology. His work continues to impact various industries, showcasing the importance of innovation in scientific research.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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