The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 14, 1993

Filed:

Dec. 15, 1992
Applicant:
Inventors:

Yoshiyuki Tohge, Yokohama, JP;

Naoki Yuguchi, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G08B / ; G01N / ;
U.S. Cl.
CPC ...
340611 ; 340607 ; 356338 ; 324 714 ; 73199 ;
Abstract

A particle analyzing apparatus having sample liquid pressurizing means for pressurizing sample liquid containing therein particles to be examined and supplying it to a portion to be examined, sheath liquid pressurizing means for pressurizing sheath liquid and supplying it to the portion to be examined in such a manner as to surround the sample liquid, a pressure sensor provided in the flow path of the sheath liquid between the sheath liquid pressurizing means and the portion to be examined, pressure control means for controlling the pressure value of the sheath liquid pressurizing means so that the output of the pressure sensor becomes constant, and means for applying light to the portion to be examined and photometering light emitted from the particles to be examined to thereby effect particle analysis.


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