Nukata, Japan

Yoshitaka Nagayama

This inventor holds 1 USPTO granted patent. Top assignee: Nippondenso Co., Ltd.. Active years: 1996.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshitaka Nagayama. Retrieved from https://idiyas.com/inventor/yoshitaka-nagayama

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 30(Granted Patents)


Company Filing History:


Years Active: 1996

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1 patent (USPTO):Explore Patents

Title: The Innovations of Yoshitaka Nagayama

Introduction

Yoshitaka Nagayama is a notable inventor based in Nukata, Japan. He has made significant contributions to the field of semiconductor technology. His work focuses on enhancing the reliability and performance of semiconductor devices.

Latest Patents

Yoshitaka Nagayama holds a patent for a semiconductor device designed for sensing strain on a substrate. This invention addresses the challenges associated with fixing a sensor element for sensing stress on a substrate using an adhesive for semiconductors. The patent aims to resolve issues related to stress applied from the substrate due to temperature changes and defects in the wire bonding process. The innovative semiconductor device utilizes an adhesive prepared by combining resin beads made of resin with a base adhesive made of flexible resin.

Career Highlights

Yoshitaka Nagayama is associated with Nippondenso Co., Ltd., a company known for its advancements in automotive technology and electronics. His work at Nippondenso has allowed him to contribute to the development of cutting-edge semiconductor solutions.

Collaborations

Yoshitaka has collaborated with notable colleagues, including Masahiko Kitano and Takushi Maeda. Their combined expertise has fostered innovation and progress in their respective fields.

Conclusion

Yoshitaka Nagayama's contributions to semiconductor technology exemplify the importance of innovation in addressing complex challenges. His patent for a semiconductor device showcases his commitment to enhancing the functionality and reliability of electronic components.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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