This inventor holds 5 USPTO granted patents and 1 published patent application and 2 EPO patents. Top assignee: Hamamatsu-Photonics K.k.. Active years: 2021-2024.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Hamamatsu, JP (2021)
- Fujisawa, JP (2021 - 2024)
Company Filing History:
Years Active: 2021-2024
Title: Innovations by Yoshitaka Iwaki
Introduction
Yoshitaka Iwaki is a prominent inventor based in Fujisawa, Japan. He has made significant contributions to the field of semiconductor technology, holding a total of 5 patents. His work focuses on enhancing the examination and inspection processes of semiconductor apparatuses.
Latest Patents
Iwaki's latest patents include a semiconductor apparatus examination method and a semiconductor inspection device. The examination method involves detecting light from multiple positions within a semiconductor apparatus and acquiring corresponding waveforms. This process allows for the generation of images based on specific timings, facilitating the identification of drive elements within the apparatus. The inspection device features a sophisticated system that includes a light source, mirrors, and Galvano mirrors, all controlled to optimize the optical paths for effective semiconductor device analysis.
Career Highlights
Yoshitaka Iwaki is currently employed at Hamamatsu Photonics K.K., where he continues to innovate in the field of semiconductor technology. His expertise has led to advancements that improve the efficiency and accuracy of semiconductor inspections.
Collaborations
Iwaki collaborates with talented coworkers such as Tomonori Nakamura and Yuji Nakajima, contributing to a dynamic team focused on pushing the boundaries of semiconductor technology.
Conclusion
Yoshitaka Iwaki's contributions to semiconductor technology through his innovative patents and collaborative efforts highlight his importance in the field. His work continues to influence advancements in semiconductor examination and inspection methods.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
