This inventor holds 2 USPTO granted patents. Top assignee: Other. Active years: 1999-2005.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Tokyo 171, JP (1999)
- Tokyo JP (2005)
Company Filing History:
Years Active: 1999-2005
Title: Yoshiro Yamada: Innovator in Surface Inspection Technology
Introduction
Yoshiro Yamada is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of surface inspection technology, holding a total of 2 patents. His innovative work focuses on enhancing the accuracy and efficiency of surface inspection processes.
Latest Patents
Yamada's latest patents include an "Apparatus and method for inspecting a surface of an inspection object." This surface inspection apparatus utilizes image data obtained by scanning an inspection object with a camera that features a line image sensor. The apparatus comprises a line memory and an adder to combine image data from two adjacent main scanning lines, generating a comprehensive image data string. The calculation processor further processes this data in blocks of continuous pixels, calculating a correlated value of the added data in adjacent blocks. This correlated value is then compared to a threshold value to determine the surface state of the inspection object. Another notable patent is the "Image pickup apparatus," which complements his work in surface inspection.
Career Highlights
Yamada has established himself as a key figure in the field of surface inspection technology. His innovative approaches have led to advancements that improve the reliability of inspection processes in various industries. His work is characterized by a commitment to precision and efficiency.
Collaborations
Yamada collaborates with Mikio Saito, a fellow innovator in the field. Their partnership has fostered a creative environment that encourages the development of cutting-edge technologies.
Conclusion
Yoshiro Yamada's contributions to surface inspection technology exemplify the impact of innovation in enhancing industrial processes. His patents reflect a deep understanding of the challenges in surface inspection and a dedication to finding effective solutions.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile