The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2005
Filed:
Mar. 07, 2003
Yoshiro Yamada, Tokyo 152-0022, JP;
Yoshiro Yamada, Tokyo 152-0022, JP;
Other;
Abstract
A surface inspection apparatus inputs image data obtained by scanning an inspection object by a camera which includes a line image sensor into calculation means. The surface inspection apparatus comprises a line memory and adder to add image data of two adjacent main scanning lines to generate an image data string, adds the image data in a block including a plurality of pixels continuous in a main scanning direction by the calculation processor to generate added data in the block, calculates a correlated value of the added data in the blocks adjacent to each other in the main scanning direction, and judges the correlated value with a threshold value by judgment means to obtain a surface state of the inspection object.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile