This inventor holds 1 USPTO granted patent. Top assignee: Hitachi-High-Technologies Corporation. Active years: 2006.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2006
Title: Yoshinori Numata: Innovator in Defect Inspection Technology
Introduction
Yoshinori Numata is a notable inventor based in Hitachinaka, Japan. He has made significant contributions to the field of defect inspection technology, particularly through his innovative patent.
Latest Patents
Yoshinori Numata holds a patent for a defect inspecting apparatus. This apparatus integrates a plurality of probes designed to measure the electric characteristics of samples that include fine wiring patterns. It features a charged-particle beam unit and incorporates graphic user interfaces (GUI) to facilitate the simple control of multiple probes. The apparatus also includes a probe image processing unit that displays the probes on a screen, a selecting unit for choosing an operable probe, and a display unit that shows the selected probe's status.
Career Highlights
Yoshinori Numata is associated with Hitachi High-Technologies Corporation, where he has been instrumental in advancing defect inspection methodologies. His work has contributed to enhancing the precision and efficiency of electronic component manufacturing.
Collaborations
He has collaborated with notable colleagues such as Tsutomu Saito and Osamu Yamada, further enriching the innovation landscape within his field.
Conclusion
Yoshinori Numata's contributions to defect inspection technology exemplify the impact of innovative thinking in engineering. His patent reflects a commitment to improving the quality and reliability of electronic devices.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile