Odawara, Japan

Yoshinobu Naitoh

This inventor holds 1 USPTO granted patent. Top assignee: Anritsu Corporation. Active years: 1993.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshinobu Naitoh. Retrieved from https://idiyas.com/inventor/yoshinobu-naitoh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 12(Granted Patents)


Company Filing History:


Years Active: 1993

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1 patent (USPTO):Explore Patents

Title: The Innovations of Yoshinobu Naitoh

Introduction

Yoshinobu Naitoh is a notable inventor based in Odawara, Japan. He has made significant contributions to the field of sensing technology, particularly through his innovative patent. His work is recognized for its potential applications in various industries.

Latest Patents

Yoshinobu Naitoh holds a patent for a "Sensing system for measuring specific value of substance to be measured." This invention showcases his expertise in developing advanced measurement systems that can enhance accuracy and efficiency in various applications.

Career Highlights

Naitoh is currently employed at Anritsu Corporation, a leading company in the field of telecommunications and measurement solutions. His role at Anritsu has allowed him to further his research and development efforts, contributing to the company's reputation for innovation.

Collaborations

Throughout his career, Yoshinobu Naitoh has collaborated with talented individuals such as Jun Hiraoka and Setsuo Kodato. These partnerships have fostered a creative environment that encourages the exchange of ideas and the development of groundbreaking technologies.

Conclusion

Yoshinobu Naitoh's contributions to the field of sensing technology exemplify the impact of innovative thinking in advancing measurement systems. His work continues to inspire future developments in this critical area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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