Takamatsu, Japan

Yoshikiyo Kagawa

This inventor holds 1 USPTO granted patent. Top assignee: Purex Corporation. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshikiyo Kagawa. Retrieved from https://idiyas.com/inventor/yoshikiyo-kagawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Innovations of Yoshikiyo Kagawa in Sheet-like Product Inspection

Introduction

Yoshikiyo Kagawa is a notable inventor based in Takamatsu, Japan. He has made significant contributions to the field of product inspection, particularly focusing on sheet-like products. His innovative approach addresses the challenges of identifying defects in products with varying color reproducibility.

Latest Patents

Kagawa holds a patent for a "Sheet-like product inspecting method and device." The objective of this invention is to provide an inspection method and device capable of distinguishing between black dirt, non-black dirt, and tears without relying on pattern recognition as a defect. This is particularly useful in defect inspections of dirt, tears, and deformed shapes in sheet-like products that exhibit differences in color reproducibility, such as variations, color unevenness, and color fading.

Career Highlights

Yoshikiyo Kagawa is associated with Purex Corporation, where he applies his expertise in product inspection technologies. His work has led to advancements in the methods used for quality control in manufacturing processes.

Conclusion

Yoshikiyo Kagawa's innovative contributions to the inspection of sheet-like products demonstrate his commitment to enhancing quality control in manufacturing. His patented methods provide valuable solutions for identifying defects, ensuring higher standards in product quality.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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