The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2012
Filed:
Apr. 04, 2007
Yoshikiyo Kagawa, Takamatsu, JP;
Yoshikiyo Kagawa, Takamatsu, JP;
Purex Corporation, Takamatsu-shi, JP;
Abstract
Object: To provide an inspecting method and device which can distinguish black dirt, non-black dirt and a tear, without determining a pattern as a defect, in a defect inspection of dirt, a tear, a deformed shape, etc. in sheet-like products having differences in color reproducibility (such as variations, color unevenness and/or color fading). Solving Means: A sheet-like product inspecting method and device are characterized in preparing an inspection plate having a plurality of different color regions and a color camera capable of picking up images of plural lines of R, G and B components, acquiring R, G and B image data of a sheet-like product that is passed over the inspection plate, obtaining a synthesized image of an R component image, a G component image, and a B component image, detecting a color changed region in the synthesized image, and determining a defect type depending on whether a color of the color changed region falls within a certain range of setting parameter, which is stored in advance per defect type.