Saitama, Japan

Yoshikazu Sudo

This inventor holds 1 USPTO granted patent. Top assignees: Mitsubishi Denki Kabushiki Kaisha, Nippon Telegraph and Telephone Public Corporation. Active years: 1986.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshikazu Sudo. Retrieved from https://idiyas.com/inventor/yoshikazu-sudo-uhuqfudg

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 9.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 1986

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1 patent (USPTO):Explore Patents

Title: The Innovations of Yoshikazu Sudo

Introduction

Yoshikazu Sudo is a notable inventor based in Saitama, Japan. He is recognized for his contributions to the field of ultrasonic inspection technology. His innovative work has led to the development of a unique apparatus that enhances the ability to detect defects in materials.

Latest Patents

Yoshikazu Sudo holds a patent for an ultrasonic inspecting apparatus. This invention measures the propagation time of ultrasonic waves between a transmitting point and a receiving point on the outer circumference of a subject material. By performing a predetermined sequence of operations with the measured propagation times and known constants, the apparatus provides internal information about the material, including the location and shape of any defects.

Career Highlights

Throughout his career, Sudo has worked with prominent companies such as Mitsubishi Electric Corporation and Nippon Telegraph and Telephone Public Corporation. His experience in these organizations has contributed significantly to his expertise in ultrasonic technology.

Collaborations

Sudo has collaborated with notable colleagues, including Haruzi Sato and Kishio Arita. Their combined efforts have further advanced the field of ultrasonic inspection.

Conclusion

Yoshikazu Sudo's innovative work in ultrasonic inspection technology has made a significant impact in the field. His patent for the ultrasonic inspecting apparatus showcases his ability to address complex challenges in material analysis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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