The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 1986
Filed:
Apr. 20, 1984
Kishio Arita, Tokyo, JP;
Susumu Mitani, Saitama, JP;
Hideo Sakai, Saitama, JP;
Yoshikazu Sudo, Saitama, JP;
Yoshitaka Koide, Tokyo, JP;
Haruzi Sato, Kanagawa, JP;
Yoshio Habuka, Kanagawa, JP;
Takashi Kozakai, Kanagawa, JP;
Hiroji Tanaka, Kanagawa, JP;
Nippon Telegraph and Telephone Public Corporation, Tokyo, JP;
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Abstract
In an ultrasonic inspecting apparatus, propagation time is measured between a transmitting point of an ultrasonic wave from outer circumference of a subject material and a receiving point of the ultrasonic wave at another point on the outer circumference spaced apart from the transmitting point by a predetermined angle, and a predetermined sequence of operations is performed with the measured propagation times and the known constants, thereby internal information concerning the material, including location and shape of a defect existing therein, is provided.