Okazaki, Japan

Yoshikatsu Sekiai

This inventor holds 1 USPTO granted patent. Top assignee: Denso Corporation. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshikatsu Sekiai. Retrieved from https://idiyas.com/inventor/yoshikatsu-sekiai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Innovations by Yoshikatsu Sekiai

Introduction

Yoshikatsu Sekiai is a notable inventor based in Okazaki, Japan. He has made significant contributions to the field of inspection technology, particularly in methods for detecting airtightness failures. His innovative approach has led to the development of a unique patent that enhances the reliability of inspection processes.

Latest Patents

Yoshikatsu Sekiai holds a patent for a "Method and apparatus for inspecting for airtightness failure." This invention involves a systematic approach to detecting leaks in inspection objects. The process includes generating a constant flow of gas, sealing a tracer gas under pressure, measuring the amount of leaked gas, and cleaning the flow paths after measurement. This method significantly improves the accuracy and efficiency of airtightness inspections.

Career Highlights

Sekiai is associated with Denso Corporation, a leading company in the automotive industry. His work at Denso has allowed him to apply his innovative ideas in practical settings, contributing to advancements in inspection technologies. His dedication to improving inspection methods has made a positive impact on the industry.

Collaborations

Yoshikatsu Sekiai has collaborated with notable colleagues, including Atsushi Otani and Hiroshi Shioya. These collaborations have fostered a creative environment that encourages the exchange of ideas and the development of innovative solutions.

Conclusion

Yoshikatsu Sekiai's contributions to inspection technology through his patent demonstrate his commitment to innovation. His work not only enhances the efficiency of inspection processes but also reflects the importance of collaboration in driving technological advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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