The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 2004

Filed:

Feb. 05, 2003
Applicant:
Inventors:

Hiroshi Shioya, Nagoya, JP;

Atsushi Otani, Ama-gun, JP;

Hiroaki Sasaki, Nagoya, JP;

Yoshikatsu Sekiai, Okazaki, JP;

Assignee:

Denso Corporation, Kariya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 3/04 ;
U.S. Cl.
CPC ...
G01M 3/04 ;
Abstract

An airtightness failure inspection method according to the present invention comprises an initial step of generating an independent constant flow of gas in the interior of a cover formed in such a manner as to surround an inspecting area of an inspection object and a detector , a pre-inspection step of sealing a tracer gas in the interior of the inspection object under pressure and placing the cover over the inspecting area, a measuring step of introducing a gas containing the tracer gas that has leaked from the inspecting area and which is drawn out of the cover into the detector for measuring the amount of the leak and a cleaning step of cleaning up flow paths constituting the flow path systems and instruments including the detector after the measurement is completed.


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