Kyoto, Japan

Yoshihiro Takigami

This inventor holds 1 USPTO granted patent. Top assignee: Nissin Ion Equipment Co., Ltd.. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshihiro Takigami. Retrieved from https://idiyas.com/inventor/yoshihiro-takigami

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Yoshihiro Takigami: Innovator in Beam Current Measurement Technology

Introduction

Yoshihiro Takigami is a prominent inventor based in Kyoto, Japan. He has made significant contributions to the field of charged particle beam technology. His innovative work has led to the development of a unique beam current measuring device.

Latest Patents

Takigami holds a patent for a beam current measuring device and charged particle beam irradiation apparatus. This device is capable of performing measurement of a beam current distribution of a charged particle beam seamlessly and continuously in an arbitrary direction. The design includes collector electrodes whose detection regions seamlessly continue in the arrangement direction thereof. He has 1 patent to his name.

Career Highlights

Yoshihiro Takigami is associated with Nissin Ion Equipment Co., Ltd., where he has been instrumental in advancing technologies related to ion equipment. His expertise in beam current measurement has positioned him as a key figure in his field.

Collaborations

Throughout his career, Takigami has collaborated with notable colleagues, including Hideyasu Une and Tetsuro Yamamoto. These collaborations have further enhanced his contributions to the field of charged particle technology.

Conclusion

Yoshihiro Takigami's innovative work in beam current measurement technology has made a lasting impact in the field. His dedication to advancing this technology continues to inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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