Toyokawa, Japan

Yoshihiro Ohkuwa

This inventor holds 4 USPTO granted patents and 1 published patent application. Top assignee: Toyota Jidosha Kabushiki Kaisha. Active years: 1999-2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshihiro Ohkuwa. Retrieved from https://idiyas.com/inventor/yoshihiro-ohkuwa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 4 

% Patents Active = 75.0

Average Co-Inventor Count = 2.3

ph-index = 2

Forward Citations = 22(Granted Patents)


Location History:

  • Susono, JP (1999)
  • Hoi-gun, JP (2012)
  • Toyokawa, JP (2019 - 2020)

Company Filing History:


Years Active: 1999-2020

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4 patents (USPTO):Explore Patents

Title: Yoshihiro Ohkuwa - Innovator in Control Target Processing Systems

Introduction

Yoshihiro Ohkuwa is an inventor based in Numadu-shi, Japan. He has made contributions to the field of control target processing systems. His innovative approach focuses on generating and processing time-series data to enhance control mechanisms.

Latest Patent Applications

Yoshihiro Ohkuwa has filed a patent application for a "CONTROL TARGET PROCESSING SYSTEM." This system includes a first generating unit that produces first time-series data based on input values. It also features a second generating unit composed of multiple processing units that exchange time-series data and calculate intermediate computation values. The system is designed to generate second time-series data from these intermediate values. Additionally, a selecting unit is included to choose a selection value based on specific conditions, and an output unit calculates and outputs a control variable for managing a controlled object.

Conclusion

Yoshihiro Ohkuwa's work in developing a control target processing system showcases his innovative spirit and dedication to advancing technology. His contributions, although not yet reflected in granted patents, highlight the potential for future developments in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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