Tokyo, Japan

Yoshihiro Isozaki

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi High-Tech Corporation. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshihiro Isozaki. Retrieved from https://idiyas.com/inventor/yoshihiro-isozaki

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: The Innovations of Yoshihiro Isozaki

Introduction

Yoshihiro Isozaki is a prominent inventor based in Tokyo, Japan. He is known for his contributions to the field of surface analysis technology. His work has significantly impacted the accuracy and quality of measurements in scientific research.

Latest Patents

Isozaki holds a patent for a surface analysis device. This invention enhances measurement accuracy even when local deviations occur in height information due to atmospheric pressure changes. The device includes an airtight tank, a stage for holding samples, a scanning probe microscope (SPM) for surface measurement, a sensor for atmospheric pressure, and a computer system for data analysis.

Career Highlights

Yoshihiro Isozaki is associated with Hitachi High-Tech Corporation, where he has made significant advancements in surface analysis technology. His innovative approach has led to improved methodologies in scientific measurements.

Collaborations

Isozaki has collaborated with notable colleagues, including Ritsuo Fukaya and Yasuhiro Ando. Their combined expertise has contributed to the development of advanced technologies in their field.

Conclusion

Yoshihiro Isozaki's work in surface analysis technology exemplifies the importance of innovation in scientific research. His contributions continue to influence the accuracy of measurements in various applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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