Tokyo, Japan

Yoshihiro Ishiguro

This inventor holds 1 USPTO granted patent. Top assignee: Newcreation Co., Ltd.. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshihiro Ishiguro. Retrieved from https://idiyas.com/inventor/yoshihiro-ishiguro

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: Yoshihiro Ishiguro: Innovator in Surface Inspection Technology

Introduction

Yoshihiro Ishiguro is a prominent inventor based in Tokyo, Japan. He is known for his significant contributions to the field of surface inspection technology. With a focus on high-accuracy measurement methods, Ishiguro has made strides in enhancing the efficiency of surface analysis.

Latest Patents

Ishiguro holds a patent for a surface inspecting device and method. This innovative method enables the measurement of the configuration of patterns with irregularities across a wide surface area with high accuracy in a single operation. The process involves irradiating a measurement objective region with illuminating light at an oblique angle, forming an image of the reflected light, and analyzing the spatial frequencies of the luminance data to extract desired frequency components.

Career Highlights

Ishiguro is associated with Newcreation Co., Ltd., where he applies his expertise in developing advanced surface inspection technologies. His work has been instrumental in improving the accuracy and efficiency of surface measurements in various applications.

Collaborations

Ishiguro has collaborated with notable colleagues, including Motoshi Sakai and Kazumi Haga. Their combined efforts have contributed to the advancement of innovative technologies in their field.

Conclusion

Yoshihiro Ishiguro's work in surface inspection technology exemplifies the impact of innovation on industrial applications. His patented methods continue to influence the way surface measurements are conducted, showcasing the importance of precision in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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