Kanagawa, Japan

Yoshihiko Takahashi


Average Co-Inventor Count = 4.4

ph-index = 1

Forward Citations = 1(Granted Patents)


Location History:

  • Kawasaki, JP (2006)
  • Kanagawa, JP (2019)

Company Filing History:


Years Active: 2006-2019

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2 patents (USPTO):Explore Patents

Title: Innovations by Yoshihiko Takahashi

Introduction

Yoshihiko Takahashi is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of measurement technology, holding two patents that showcase his innovative spirit and technical expertise.

Latest Patents

Takahashi's latest patents include a surface texture measuring apparatus and an alignment adjuster for probes. The surface texture measuring apparatus features an X axis displacement mechanism and a Y axis displacement mechanism that allow for the precise measurement of a measurable object's interior wall. This apparatus utilizes a measurement sensor that can assess surface texture without contact, ensuring accuracy and efficiency. Additionally, the Z axis displacement mechanism enables the sensor to face the interior wall, while the W axis and θ axis displacement mechanisms facilitate further adjustments for optimal measurement. His second patent, the alignment adjuster of the probe, is designed to adjust the angle of a probe used for measuring workpiece configurations. This innovation ensures that the probe aligns accurately with a reference axis line, preventing interference and potential damage during measurements.

Career Highlights

Yoshihiko Takahashi is currently employed at Mitutoyo Corporation, a leading company in precision measurement instruments. His work at Mitutoyo has allowed him to develop and refine technologies that enhance measurement accuracy and reliability.

Collaborations

Takahashi has collaborated with esteemed colleagues such as Shuichi Kamiyama and Masanori Arai. Their combined expertise has contributed to the advancement of measurement technologies and innovations within the industry.

Conclusion

Yoshihiko Takahashi's contributions to measurement technology through his patents reflect his dedication to innovation and precision. His work continues to influence the field, showcasing the importance of advancements in measurement instruments.

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