Mitutoyo Corporation

Yoshihiko Takahashi

Masanori Arai

Shuichi Kamiyama

Sadayuki Matsumiya

Hiroshi Sakai

Hidemitsu Asano

Hiromu Maie

Ken Motohashi

A surface texture measuring apparatus includes an X axis displacement mechanism and a Y axis displacement mechanism displacing a measurable object having an interior wall along an XY plane; a measurement sensor measuring a surface texture of the interior wall without contact; a Z axis displacement mechanism displacing the measurement sensor in a Z axis direction orthogonal to the XY plane and bringing the measurement sensor to face the interior wall; a W axis displacement mechanism displacing the measurement sensor facing the interior wall in a normal direction of the interior wall; and a &#x3b8; axis displacement mechanism displacing the measurement sensor facing the interior wall along the interior wall.

Surface texture measuring apparatus

A probe alignment adjuster () for adjusting an angle of a probe () for measuring a configuration of a workpiece has an angle adjuster () capable of adjusting the angle of the probe so that the angle aligns with a reference axis line. Since the angle of the probe and a hole angle can be accurately coincided in measurement by coinciding the angle of the probe () and the reference axis line, interference with a sidewall caused in inserting into a deep hole can be avoided, thereby preventing damage on the probe.

Alignment adjuster of probe, measuring instrument and alignment adjusting method of probe

Growing community of inventors

Kanagawa, Japan

Yoshihiko Takahashi