Tokyo, Japan

Yoshihiko Hirai

This inventor holds 43 USPTO granted patents, primarily in Liquid Crystal Displays. Top assignees: Nec Corporation, Nec Lcd Technologies, Ltd., Nec C Orporation. Active years: 1985-2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshihiko Hirai. Retrieved from https://idiyas.com/inventor/yoshihiko-hirai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 83.7

Average Co-Inventor Count = 3.5

ph-index = 17

Forward Citations = 1,063(Granted Patents)


Location History:

  • Kawasaki, JP (2010)
  • Tokyo, JP (1985 - 2011)

Company Filing History:


Years Active: 1985-2011

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Areas of Expertise:
Liquid Crystal Display
Active Matrix
Manufacturing Method
Parallax Suppression
In-Plane Switching
Optical Compensation
Tablet Integration
Flicker Reduction
Orientation Control
Display Operation
Pixel Electrode
Symmetrical Diodes
43 patents (USPTO):Explore Patents

Title: Yoshihiko Hirai - Innovative Inventor from Tokyo

Introduction: Yoshihiko Hirai is a renowned inventor based in Tokyo, Japan, known for his groundbreaking contributions to various technological fields.

Latest Patents: Yoshihiko Hirai holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his diverse range of expertise.

Career Highlights: With over two decades of experience in the industry, Hirai has worked with leading research institutions and universities to develop cutting-edge solutions that have revolutionized the way we approach complex challenges.

Collaborations: Throughout his career, Yoshihiko Hirai has collaborated with top companies and fellow inventors to bring his ideas to life, fostering a culture of innovation and creativity in the field.

Conclusion: Yoshihiko Hirai's passion for pushing the boundaries of technology and his relentless pursuit of excellence continue to inspire the next generation of inventors and innovators worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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