This inventor holds 1 USPTO granted patent. Top assignee: Fujitsu Microelectronics Limited. Active years: 2010.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2010
Title: Yoshihiko Endou: Innovator in Probe Card Technology
Introduction
Yoshihiko Endou is a notable inventor based in Kawasaki, Japan. He has made significant contributions to the field of probe card technology, particularly through his innovative evaluation methods.
Latest Patents
Yoshihiko Endou holds a patent for an "Evaluation method of probe mark of probe needle of probe card using imaginary electrode pad and designated determination frame." This method involves forming a probe mark on a probe mark evaluation wafer, recognizing the probe mark through imaging, and overlapping an imaginary electrode pad with the recognized probe mark for evaluation. He has 1 patent to his name.
Career Highlights
Endou is currently employed at Fujitsu Microelectronics Limited, where he continues to develop and refine technologies related to probe cards. His work has been instrumental in enhancing the accuracy and efficiency of probe mark evaluations.
Collaborations
He has collaborated with notable colleagues such as Yoshikazu Arisaka and Tatsuya Miyazaki, contributing to advancements in their shared field of expertise.
Conclusion
Yoshihiko Endou's innovative work in probe card technology exemplifies the impact of dedicated inventors in the tech industry. His contributions continue to influence the development of more efficient evaluation methods.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile