Shirakawa, Japan

Yoshiharu Shima

This inventor holds 1 USPTO granted patent. Top assignee: Sumitomo Rubber Industries Limited. Active years: 1984.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshiharu Shima. Retrieved from https://idiyas.com/inventor/yoshiharu-shima-jzppnr25

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 1984

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1 patent (USPTO):Explore Patents

Title: Yoshiharu Shima: Tire Inspection Innovation

Introduction

Yoshiharu Shima is an inventor associated with Shirakawa, Japan, and Sumitomo Rubber Industries Limited. His recorded patent concerns automated inspection of tire sidewalls.

Latest Patents

Shima’s listed patent is “Tire Inspecting Apparatus.” The invention is designed to detect excessive indents or defects on one or both sidewalls of an inflated tire. Supply, inspection, and delivery conveyors are arranged in line, while contact detectors touch the tire’s sidewalls as the tire rotates above the inspection conveyor. The detectors generate an electrical signal when they identify an excessive indent or defect. Shima is credited with 1 patent in the information provided.

Career Highlights

Shima’s patent reflects work on automating tire quality inspection. By using contact detectors and a conveyor-based process, the apparatus is intended to identify sidewall irregularities during production or inspection.

Collaborations

The provided information names Minoru Kikuchi and Mitsuru Fujimoto as Shima’s coworkers. It does not specify their roles in the patent or whether they collaborated on this invention.

Conclusion

Yoshiharu Shima’s recorded invention focuses on automated detection of tire sidewall defects, connecting his patent work with tire inspection at Sumitomo Rubber Industries Limited.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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