The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 18, 1984

Filed:

Jun. 29, 1982
Applicant:
Inventors:

Mitsuru Fujimoto, Shirakawa, JP;

Yoshiharu Shima, Shirakawa, JP;

Hironobu Motooka, Shirakawa, JP;

Minoru Kikuchi, Fukushima, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M / ;
U.S. Cl.
CPC ...
73146 ;
Abstract

A tire inspecting apparatus for automatically detecting the presence of at least one excessive indent or defect on one or both side walls of the tire comprises supply inspection and delivery conveyors arranged in line with each other. The apparatus includes contact detectors adapted to contact the side walls of the tire and to detect the presence of the excessive indent on the side wall of the tire while the tire in an inflated condition is rotated relative to the contact detectors at a position above the inspection conveyor. These contact detectors generate an electrical signal indicative of the presence of the excessive tire.


Find Patent Forward Citations

Fujimoto, Mitsuru. (1984). Tire inspecting apparatus (U.S. Patent No. 4488430). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4488430

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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