Tokyo, Japan

Yoshiharu Kaneshima

This inventor holds 2 USPTO granted patents. Top assignee: Ihi Corporation. Active years: 2025-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshiharu Kaneshima. Retrieved from https://idiyas.com/inventor/yoshiharu-kaneshima

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2025-2026

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2 patents (USPTO):Explore Patents

Title: Innovations by Yoshiharu Kaneshima

Introduction

Yoshiharu Kaneshima is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of vehicle technology, particularly in the detection of loading anomalies.

Latest Patents

Kaneshima holds a patent for a "Detection method of loading anomaly on vehicle, and detection apparatus thereof." This innovative method constructs a control map that relates the steering control value of a vehicle to its proper turning radius. By utilizing a self-location detection function, the actual turning radius of the vehicle is calculated. A comparison is then made between the proper turning radius and the actual turning radius. If the difference falls outside a predetermined reference range, it indicates a loading anomaly of the cargo.

Career Highlights

Yoshiharu Kaneshima is currently employed at IHI Corporation, where he continues to develop and refine his inventions. His work focuses on enhancing vehicle safety and performance through advanced detection methods.

Collaborations

Kaneshima collaborates with Satoru Tagawa, a fellow innovator, to further advance their research and development efforts in vehicle technology.

Conclusion

Yoshiharu Kaneshima's contributions to vehicle technology through his innovative patent demonstrate his commitment to improving safety and efficiency in transportation. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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