Tokyo, Japan

Yoshie Kohno

This inventor holds 1 USPTO granted patent. Top assignee: Nec Corporation. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshie Kohno. Retrieved from https://idiyas.com/inventor/yoshie-kohno

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 36(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: The Innovations of Yoshie Kohno

Introduction

Yoshie Kohno is a prominent inventor based in Tokyo, Japan. She has made significant contributions to the field of quantum technology, particularly in the area of quantum key distribution. Her innovative work has garnered attention and respect within the scientific community.

Latest Patents

Yoshie Kohno holds a patent for a "Quantum key distribution method and apparatus." This patent outlines a method for testing the reliability of a quantum key distribution apparatus. The method involves producing a set of quanta, measuring them, and exchanging information to confirm the reliability of the quantum apparatus based on quantum correlation.

Career Highlights

Kohno is associated with NEC Corporation, where she applies her expertise in quantum technologies. Her work at NEC has positioned her as a leader in the development of secure communication methods using quantum mechanics.

Collaborations

Yoshie Kohno collaborates with notable colleagues, including Dominic Mayers and Yoshihiro Nambu. These partnerships enhance her research and contribute to advancements in quantum technology.

Conclusion

Yoshie Kohno's contributions to quantum key distribution exemplify her innovative spirit and dedication to advancing technology. Her work continues to influence the field and pave the way for future developments in secure communication.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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