The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2004
Filed:
Jun. 18, 1999
Dominic Mayers, Plainsboro, NJ (US);
Yoshie Kohno, Tokyo, JP;
Yoshihiro Nambu, Tokyo, JP;
Akihisa Tomita, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
A method for testing the reliability of a quantum key distribution apparatus is provided. The method includes the steps of: producing a set of quanta by the sender, the set of quanta comprising first, second, and third quantum, the first, second, and third quantum having a quantum correlation; measuring the first and second quantum at a sender using one of two prearranged bases; transmitting the third quantum to the receiver over the quantum channel; measuring the third quantum at a receiver using one of the two prearranged bases; and exchanging information regarding the measured bases between the sender and receiver over a public channel to check for a known behavior of the quantum apparatus based upon the quantum correlation, wherein if the quantum apparatus behaves as is known or within a tolerable limit the reliability of the quantum apparatus is confirmed. A similar method for quantum key distribution is also disclosed.