Kumamoto, Japan

Yoshiaki Ohtsuka


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: Yoshiaki Ohtsuka: Innovator in Optical Time Domain Reflectometry

Introduction

Yoshiaki Ohtsuka is a notable inventor based in Kumamoto, Japan. He has made significant contributions to the field of optical time domain reflectometry, particularly in the area of filter processing systems. His innovative work has led to the development of a patented technology that enhances the measurement of chromatic dispersion.

Latest Patents

Ohtsuka holds a patent for a "Filter processing system for the output signal of optical time domain reflectometer in the chromatic dispersion distribution measurement apparatus." This system allows for the automatic setting of a frequency pass-band, providing the optimum filter for an input signal. The method involves establishing measuring-condition parameters, generating an ideal signal waveform based on chromatic dispersion values, and correlating this with the filter input signal. The process includes comparing correlation results to a threshold value to determine minimum and maximum chromatic dispersion values, which are then used for filter processing of the OTDR output.

Career Highlights

Throughout his career, Ohtsuka has worked with reputable companies such as Ando Electric Company and Kyushu Ando Electric Company Limited. His experience in these organizations has contributed to his expertise in optical technologies and innovations.

Collaborations

Ohtsuka has collaborated with notable colleagues, including Yoshimitsu Asahina and Takao Suzuki. These partnerships have likely fostered a creative environment that has led to advancements in their respective fields.

Conclusion

Yoshiaki Ohtsuka's contributions to optical time domain reflectometry through his patented filter processing system demonstrate his innovative spirit and technical expertise. His work continues to influence the field and showcases the importance of advancements in measurement technologies.

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