The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2005
Filed:
Jan. 16, 2003
Yoshimitsu Asahina, Fukuroi, JP;
Takao Suzuki, Hamamatu, JP;
Shoichi Aoki, Hamamatu, JP;
Yoshiaki Ohtsuka, Kumamoto, JP;
Yoshimitsu Asahina, Fukuroi, JP;
Takao Suzuki, Hamamatu, JP;
Shoichi Aoki, Hamamatu, JP;
Yoshiaki Ohtsuka, Kumamoto, JP;
Ando Electric Co., Ltd., Tokyo, JP;
Kyusyu Ando Electric Company Limited, Kumamoto, JP;
Abstract
A filter processing system making it possible to be able to set a frequency pass-band automatically and to provide the optimum filter to an input signal. A filter processing method of an output signal of an Optical Time Domain Reflectometer (OTDR) in a chromatic dispersion distribution measuring apparatus is disclosed. The filter processing method includes establishing measuring-condition parameters, generating an ideal signal waveform based on previously established chromatic dispersion values and the measuring-condition parameters, and providing correlation results between the ideal signal waveform and a filter input signal. The method also includes comparing the correlation results to a threshold value to generate a minimum chromatic dispersion value and a maximum chromatic dispersion value, and performing filter processing for the output of the OTDR based on the minimum chromatic dispersion value and the maximum chromatic dispersion value.