Yoram Uziel

Title: Yoram Uziel: Innovator in Metrology Systems

Introduction

Yoram Uziel is a notable inventor based in Milpitas, California, recognized for his contributions to metrology systems. With a total of three patents to his name, Uziel has made significant advancements in the field of optical metrology.

Latest Patents

Uziel's latest patents include an "Oscillating Secondary Stage for Frame-Mode Overlay Metrology." This invention features an oscillating secondary stage in a metrology system, which allows for capturing an image frame of a wafer at a target location while the primary stage is in motion. Another significant patent is for "Sensitive Optical Metrology in Scanning and Static Modes." This metrology system can perform measurements in both static and scanning modes, enhancing the efficiency and accuracy of inspections.

Career Highlights

Yoram Uziel is currently employed at Kla Corporation, a leading company in the field of metrology and inspection solutions. His work focuses on developing innovative technologies that improve measurement accuracy and efficiency in semiconductor manufacturing.

Collaborations

Uziel has collaborated with notable colleagues, including Andrew V Hill and Amnon Manassen, contributing to the advancement of metrology technologies through teamwork and shared expertise.

Conclusion

Yoram Uziel's innovative work in metrology systems has significantly impacted the industry, showcasing his dedication to enhancing measurement technologies. His patents reflect a commitment to advancing the field and improving the accuracy of semiconductor manufacturing processes.