Beijing, China

Yongpan Liu

USPTO Granted Patents = 7 

 

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2017-2024

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7 patents (USPTO):

Title: Innovations of Yongpan Liu in Computing Technology

Introduction

Yongpan Liu is a prominent inventor based in Beijing, China, known for his significant contributions to the field of computing technology. With a total of seven patents to his name, Liu has developed innovative devices and systems that enhance the efficiency and reliability of electronic equipment.

Latest Patents

Liu's latest patents include groundbreaking advancements in computing-in-memory technology. One of his notable inventions is a computing-in-memory array, which features a complex arrangement of switches and capacitors designed to perform high-accuracy computing operations with low circuit complexity. This technology allows for efficient data reading and writing, as well as computing-in-memory operations, all while maintaining high energy efficiency and long data retention times. Another significant patent involves a memory device based on a ferroelectric capacitor, which utilizes hysteresis characteristics to enable non-destructive reading of data and improved endurance for write operations.

Career Highlights

Throughout his career, Yongpan Liu has worked with esteemed organizations such as Tsinghua University and Huawei Technologies Co., Limited. His experience in these institutions has allowed him to collaborate with leading experts in the field and contribute to cutting-edge research and development.

Collaborations

Liu has collaborated with notable colleagues, including Huazhong Yang and Xueqing Li, further enhancing the impact of his work in the technology sector.

Conclusion

Yongpan Liu's innovative contributions to computing technology demonstrate his expertise and commitment to advancing electronic systems. His patents reflect a deep understanding of complex technologies and a drive to improve efficiency and reliability in computing applications.

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