Fremont, CA, United States of America

Yongjun Zheng

This inventor holds 2 USPTO granted patents. Top assignee: Xilinx, Inc.. Active years: 2011-2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yongjun Zheng. Retrieved from https://idiyas.com/inventor/yongjun-zheng-dkjfwlq7

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 50.0

Average Co-Inventor Count = 3.4

ph-index = 1

Forward Citations = 6(Granted Patents)


Location History:

  • Union City, CA (US) (2011)
  • Fremont, CA (US) (2012)

Company Filing History:


Years Active: 2011-2012

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2 patents (USPTO):Explore Patents

Title: Yongjun Zheng: Innovator in Integrated Circuit Technology

Introduction

Yongjun Zheng is a prominent inventor based in Fremont, CA, known for his contributions to integrated circuit technology. With a total of 2 patents, he has made significant advancements in the field, particularly in methods that enhance the performance and reliability of electronic devices.

Latest Patents

One of Yongjun Zheng's latest patents is titled "Estimating Icc Current Temperature Scaling Factor of an Integrated Circuit." This invention reduces the resources needed to estimate the Icc Current Temperature Scaling Factor (ITSF) of a device. It provides a method and apparatus to estimate ITSF from the device speed and performance characteristics, which can be measured at room temperature. The method involves determining a level of propagation delay of a portion of the integrated circuit and estimating the Icc current temperature scaling factor based on the correlation between the propagation delay and a modeled ITSF.

Another notable patent is the "Method of Metal Pattern Inspection Verification." This method evaluates an inline inspection recipe by comparing the capture rate of metal pattern defects in bounding boxes arising from failed electrical test vectors to the capture rate after the bounding box is shifted. A difference between the first and second capture rates indicates whether the inline inspection recipe is valid for capturing killer defects or if it needs adjustment. This method is particularly useful for evaluating patterned metal layers in field-programmable gate arrays (FPGAs).

Career Highlights

Yongjun Zheng is currently employed at Xilinx, Inc., a leading company in the field of programmable logic devices. His work at Xilinx has allowed him to focus on innovative solutions that address critical challenges in integrated circuit design and manufacturing.

Collaborations

Throughout his career, Yongjun has collaborated with notable colleagues, including Joe W Zhao and David Mark. These collaborations have contributed to the development of advanced technologies and methodologies in the electronics industry.

Conclusion

Yongjun Zheng's contributions to integrated circuit technology through his patents and work at Xilinx, Inc. highlight his role as an influential inventor in the field. His innovative methods continue to shape the future of electronic device performance and reliability.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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