Anhui, China

Yongjian Xu

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Chinese Academy of Sciences. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yongjian Xu. Retrieved from https://idiyas.com/inventor/yongjian-xu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Yongjian Xu - Innovator in High-Current Particle Beam Diagnosis

Introduction

Yongjian Xu is a prominent inventor based in Anhui, China. He has made significant contributions to the field of high-current particle beam diagnosis. His innovative approach has led to the development of a unique method for measuring beam divergence angles.

Latest Patents

Yongjian Xu holds a patent titled "Method for measuring beam divergence angle of high-current particle beam based on one-dimensional carbon fiber composite material." This patent outlines a method that involves collecting infrared images, obtaining temperature data, and performing various analyses to calculate the beam divergence angle. The method provides a basis for the operation parameter adjustment of an ion source, ensuring safe and stable system operation.

Career Highlights

Yongjian Xu is affiliated with the Chinese Academy of Sciences, where he has been instrumental in advancing research in particle beam technology. His work has garnered attention for its practical applications in improving diagnostic techniques.

Collaborations

Yongjian Xu has collaborated with notable colleagues, including Yue Hu and Ling Yu, contributing to the advancement of their shared research goals.

Conclusion

Yongjian Xu's innovative methods and dedication to research have made a significant impact in the field of high-current particle beam diagnosis. His contributions continue to influence advancements in this critical area of study.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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