Company Filing History:
Years Active: 2011-2013
Title: Yonghai Yue: Innovator in Transmission Electron Microscopy
Introduction
Yonghai Yue is a prominent inventor based in Beijing, China. He has made significant contributions to the field of transmission electron microscopy, particularly in the development of innovative sample holders and sensors for measuring the properties of nano-materials. With a total of 3 patents, his work has advanced the capabilities of in-situ measurements in microstructural analysis.
Latest Patents
Yonghai Yue's latest patents include a double tilt transmission electron microscope sample holder designed for in-situ measurement of microstructures. This innovative sample holder features a home-made hollow body, a sensor for measuring mechanical and electrical properties, and a unique design that allows for tilting along the Y-axis at an angle of ±30°. This capability enables concurrent measurement of mechanical and electrical parameters, enhancing the understanding of microstructures.
Another notable patent is a sensor for quantitative measurement of electromechanical properties and microstructure of nano-materials. This sensor comprises a suspended structure with pressure-sensitive resistor cantilevers and a bimetallic strip. It allows for the recording of stress-strain curves and voltage-current characteristics of low-dimensional nano-materials, providing valuable insights into their mechanical-electrical-microstructure relationships.
Career Highlights
Yonghai Yue is affiliated with the Beijing University of Technology, where he continues to push the boundaries of research in his field. His work has not only contributed to academic knowledge but has also paved the way for practical applications in various industries.
Collaborations
Yonghai Yue has collaborated with notable colleagues, including Xiaodong Han and Pan Liu. These partnerships have fostered a collaborative environment that enhances research outcomes and innovation.
Conclusion
Yonghai Yue's contributions to the field of transmission electron microscopy and nano-materials are noteworthy. His innovative patents and collaborative efforts reflect his commitment to advancing scientific knowledge and technology. His work continues to inspire future research and development in the field.