The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2011
Filed:
Dec. 07, 2009
Xiaodong Han, Beijing, CN;
Pan Liu, Beijing, CN;
Yuefei Zhang, Beijing, CN;
Yonghai Yue, Beijing, CN;
Ze Zhang, Beijing, CN;
Xiaodong Han, Beijing, CN;
Pan Liu, Beijing, CN;
Yuefei Zhang, Beijing, CN;
Yonghai Yue, Beijing, CN;
Ze Zhang, Beijing, CN;
Beijing University of Technology, Beijing, CN;
Abstract
A device for measuring electromechanical properties and microstructure of nano-materials under stress state comprises two bimetallic strips placed on an insulated metal ring plated with insulating paint, wherein the two bimetallic strips are placed in parallel or V-shaped to insulated metal ring on the same plane, one end of each bimetallic strip is fixed on the insulated metal ring, the other end of the bimetallic strip hangs inside of the insulated ring, the distance of two bimetallic strips were controlled within 0.002-1 mm. Also provided is a method for measuring electromechanical properties and microstructure of nano-materials under stress state.