Yong-Jie Ciou

Title: Yong-Jie Ciou: Innovator in Surface Measurement Technology

Introduction

Yong-Jie Ciou is a prominent inventor based in Taipei, Taiwan. He has made significant contributions to the field of surface measurement technology, particularly in the polishing industry. His innovative approach has led to advancements that enhance the efficiency of polishing processes.

Latest Patents

Yong-Jie Ciou holds a patent for a "Method, system and apparatus for uniformed surface measurement." This invention provides a system and method for uniform surface measurement, utilizing a sensor to perform measurements on a carrier within a polishing machine. The measuring trajectory of the sensor is adjusted by controlling the pivoting of a sensor carrier and the rotation of a platform in the polishing machine. This innovation allows for real-time monitoring of the polishing state of the carrier, thereby improving the overall efficiency of the polishing process.

Career Highlights

Yong-Jie Ciou is associated with Ta Liang Technology Co., Ltd., where he applies his expertise in developing advanced measurement systems. His work has been instrumental in pushing the boundaries of technology in the polishing sector.

Collaborations

Yong-Jie Ciou has collaborated with notable colleagues, including Chao-Chang Chen and Jen-Chieh Li. Their combined efforts have contributed to the success of various projects within their organization.

Conclusion

Yong-Jie Ciou's innovative contributions to surface measurement technology exemplify the impact of dedicated inventors in advancing industrial processes. His work continues to influence the efficiency of polishing techniques, showcasing the importance of innovation in technology.