Bucheon-si, South Korea

Yong-Hwi Jo


Average Co-Inventor Count = 2.3

ph-index = 2

Forward Citations = 7(Granted Patents)


Location History:

  • BuCheon, KR (2010 - 2012)
  • Bucheon-si, KR (2011 - 2012)

Company Filing History:


Years Active: 2010-2012

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4 patents (USPTO):Explore Patents

Title: Yong-Hwi Jo: Innovator in Probe Card Manufacturing

Introduction

Yong-Hwi Jo, an accomplished inventor based in Bucheon-si, South Korea, has made significant contributions to the field of probe card technology. With a total of four patents to his name, his innovative methods have advanced the way probe cards are manufactured, showcasing his creativity and engineering expertise.

Latest Patents

Among his most recent inventions is a "Method and apparatus for manufacturing a probe card." This patent outlines a process that involves preparing multiple probe modules, which include a sacrificial substrate and probes, and meticulously aligning them to create a probe module assembly of the desired dimensions. This advanced technique allows for the manufacturing of larger probe cards, which are crucial in various electronic testing applications.

Additionally, Yong-Hwi Jo developed the "Method of fabricating cantilever type probe and method of fabricating probe card using the same." This patent reveals an innovative fabrication method that minimizes damage during the process. By forming grooves in specific substrate regions and implementing selective etching, the technique significantly enhances the stability and quality of the probe tips, leading to fewer defects and improved performance.

Career Highlights

Currently, Yong-Hwi Jo is a key contributor at Phicom Corporation, where his expertise in probe technology plays a pivotal role in the company’s research and development efforts. His dedication to innovation has not only led to personal accolades but has also significantly progressed the technological landscape of electronic testing.

Collaborations

Throughout his career, Yong-Hwi Jo has collaborated with fellow inventors Ki-Joon Kim and Han-Moo Lee. Their combined efforts have fostered a dynamic environment for innovation within the realm of probe card manufacturing, leading to the advancement of multiple projects and patents.

Conclusion

Yong-Hwi Jo's contributions to the field of probe card technology exemplify the essence of invention and innovation. Through his methods and collaborations, he continues to push boundaries and enhance electronic testing capabilities, securing his position as a notable inventor in the industry.

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