The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2012
Filed:
Jul. 24, 2006
Applicants:
Ki-joon Kim, Seoul, KR;
Yong-hwi JO, Bucheon-si, KR;
Sung-young OH, Suwon-si, KR;
Jun-tae Hwang, Seoul, KR;
Inventors:
Ki-Joon Kim, Seoul, KR;
Yong-Hwi Jo, Bucheon-si, KR;
Sung-Young Oh, Suwon-si, KR;
Jun-Tae Hwang, Seoul, KR;
Assignee:
Phicom Corporation, Seoul, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/00 (2006.01); B23P 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
In a method of manufacturing a probe card, a plurality of probe modules, including a sacrificial substrate and probes on the sacrificial substrate, is prepared. The probe modules are mutually aligned to form a probe module assembly having the aligned probe modules and a desired size. The probe module assembly is then attached to a probe substrate. Thus, the probe card having a large size may be manufactured.