Saratoga, CA, United States of America

Yolanda Yuan


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Yolanda Yuan: Innovator in Memory Decoding Systems

Introduction

Yolanda Yuan is a prominent inventor based in Saratoga, CA (US). She has made significant contributions to the field of memory systems, particularly with her innovative patent that enhances the functionality of multi-plane memories. Her work is instrumental in advancing technology that supports complex memory operations.

Latest Patents

Yolanda holds a patent for a "Functional register decoding system for multiple plane operation." This decoding system is designed to route address information corresponding to distinct memory access operations to designated planes. The system features an array of functional registers dedicated to various operations, including random access read, burst read, program, erase, and erase-suspend program operations. The plane selector blocks for each plane receive address outputs from all registers, while the plane function select logic controls the routing according to memory access commands for specified planes. This innovation allows for simultaneous operations of different types in different planes and nested operations within the same plane.

Career Highlights

Yolanda Yuan is currently employed at Atmel Corporation, where she continues to develop cutting-edge technologies in memory systems. Her expertise and innovative spirit have positioned her as a key player in her field.

Collaborations

Yolanda collaborates with talented coworkers, including Jason Guo and Sai Kai Tsang. Their combined efforts contribute to the advancement of technology in memory systems.

Conclusion

Yolanda Yuan's contributions to the field of memory decoding systems exemplify her innovative spirit and dedication to technology. Her patent and work at Atmel Corporation highlight her role as a leading inventor in this critical area of research.

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