Tokyo, Japan

Yoko Oikawa


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2011

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1 patent (USPTO):

Title: Yoko Oikawa: Innovator in Semiconductor Technology

Introduction

Yoko Oikawa is a prominent inventor based in Tokyo, Japan. She has made significant contributions to the field of semiconductor technology. Her innovative work has led to the development of a method for verifying mask pattern data, which is crucial in the manufacturing of semiconductor devices.

Latest Patents

Yoko Oikawa holds 1 patent for her invention titled "Method for verifying mask pattern data, method for manufacturing mask, mask pattern verification program, and method for manufacturing semiconductor device." This patent outlines a comprehensive method that includes preparing design circuit data, creating mask pattern data, and detecting circuit mismatches. Her invention enhances the accuracy and efficiency of semiconductor manufacturing processes.

Career Highlights

Oikawa has built her career at Kabushiki Kaisha Toshiba, a leading company in the technology sector. Her role at Toshiba has allowed her to work on cutting-edge projects that push the boundaries of semiconductor technology. Her expertise and innovative mindset have made her a valuable asset to her team.

Collaborations

Yoko Oikawa has collaborated with notable colleagues such as Shigeki Nojima and Satoshi Tanaka. These collaborations have fostered an environment of innovation and creativity, leading to advancements in their respective fields.

Conclusion

Yoko Oikawa's contributions to semiconductor technology exemplify her dedication to innovation. Her patent for verifying mask pattern data is a testament to her expertise and impact in the industry. Oikawa continues to inspire future generations of inventors and engineers.

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