Hino, Japan

Yoichi Oyama

This inventor holds 1 USPTO granted patent. Top assignee: Kokusai Kogyo Co., Ltd.. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoichi Oyama. Retrieved from https://idiyas.com/inventor/yoichi-oyama-i8c87wdf

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Yoichi Oyama: Innovator in Aerial Photography Technology

Introduction

Yoichi Oyama is a notable inventor based in Hino, Japan. He has made significant contributions to the field of aerial photography through his innovative methods. His work focuses on enhancing the way aerial photographs are captured and displayed.

Latest Patents

Oyama holds a patent for a "Method of producing and displaying an aerial photograph data set." This method involves obtaining captured images that overlap in both the flight direction and a cross direction. A predetermined number of these images, which contain overlapping sections that include a target point, are selected. From these overlaps, specific image sections are chosen to create a comprehensive aerial photograph data set.

Career Highlights

Throughout his career, Oyama has been associated with Kokusai Kogyo Co., Ltd., where he has applied his expertise in aerial photography. His innovative approach has led to advancements in how aerial data is processed and utilized.

Collaborations

Oyama has worked alongside talented colleagues such as Shunji Murai and Yukio Akamatsu. Their collaborative efforts have contributed to the development of cutting-edge technologies in the field.

Conclusion

Yoichi Oyama's contributions to aerial photography through his patented methods demonstrate his innovative spirit and dedication to advancing technology. His work continues to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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