The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2010
Filed:
Sep. 08, 2006
Shunji Murai, Tokyo, JP;
Yoichi Oyama, Hino, JP;
Yoshihiko Minami, Fukuoka, JP;
Yukio Akamatsu, Tokyo, JP;
Hiroshi Takeda, Tokyo, JP;
Shunji Murai, Tokyo, JP;
Yoichi Oyama, Hino, JP;
Yoshihiko Minami, Fukuoka, JP;
Yukio Akamatsu, Tokyo, JP;
Hiroshi Takeda, Tokyo, JP;
Kokusai Kogyo Co., Ltd., Tokyo, JP;
Abstract
In the method of obtaining captures images, there is overlaps in images in the flight direction and in a direction (cross direction) that crosses the flight direction. A predetermined number of the captured images containing overlapping sections that include a target point are selected out of the obtained images in the flight direction and/or the cross direction. From the overlap sections of these captured images, selected images are obtained by selecting image sections within a specific range that contains the target point. Using the flight direction and the cross direction as axes for a matrix, the selected images are arranged to create an aerial photograph data set.