This inventor holds 2 USPTO granted patents. Top assignee: Mitutoyo Corporation. Active years: 2002-2007.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2002-2007
Title: The Innovations of Yoichi Nomura
Introduction
Yoichi Nomura is a notable inventor based in Kawasaki, Japan. He has made significant contributions to the field of measurement technology, holding 2 patents that showcase his innovative spirit and technical expertise.
Latest Patents
Nomura's latest patents include a "Method for measuring curved surface of workpiece" and a "Linear measuring machine." The first patent outlines a theoretical expression for measuring the curved surface of a workpiece using a measuring probe equipped with a stylus. It specifies the measuring area and determines the axis angles of the stylus based on coordinate values and the normal vector of a representative point. The second patent describes a linear measuring machine that features a base, a column, and a slider that can be elevated along the column. This machine includes an elevation driving mechanism with a motor for lifting and lowering the slider, as well as a touch-and-back mechanism for precise measurements.
Career Highlights
Yoichi Nomura is currently employed at Mitutoyo Corporation, a leading company in precision measurement technology. His work at Mitutoyo has allowed him to develop and refine his inventions, contributing to advancements in measurement accuracy and efficiency.
Collaborations
Nomura has collaborated with talented coworkers such as Hirokazu Michiwaki and Masaoki Yamagata. Their combined expertise has fostered an environment of innovation and creativity within their projects.
Conclusion
Yoichi Nomura's contributions to measurement technology through his patents and work at Mitutoyo Corporation highlight his role as a significant inventor in the field. His innovative methods and machines continue to influence the industry and improve measurement practices.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
