Hitachi, Japan

Yoichi Kurosawa

This inventor holds 1 USPTO granted patent. Top assignee: Sumco Corporation. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoichi Kurosawa. Retrieved from https://idiyas.com/inventor/yoichi-kurosawa-4kfa7d9p

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 10.0

ph-index = 1


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Yoichi Kurosawa: Innovator in Semiconductor Manufacturing

Introduction

Yoichi Kurosawa is a notable inventor based in Hitachi, Japan. He has made significant contributions to the field of semiconductor manufacturing, particularly through his innovative patent.

Latest Patents

Kurosawa holds a patent for an "Apparatus for manufacturing semiconductor substrates." This apparatus features support disks and holding units that securely hold semiconductor substrates. The holding unit includes a conductive material stopper that holds the brim of the semiconductor substrate. Additionally, it has a stopper holder that supports the stopper at its outer circumferential portion, a retaining member that secures the stopper to the support disk, and a heating unit that heats the stopper.

Career Highlights

Kurosawa is associated with Sumco Corporation, a leading company in the semiconductor industry. His work has been instrumental in advancing manufacturing processes and improving the efficiency of semiconductor substrate production.

Collaborations

Kurosawa has collaborated with notable colleagues such as Seiichi Nakamura and Hideki Nishihata, contributing to various projects within the semiconductor field.

Conclusion

Yoichi Kurosawa's innovative work in semiconductor manufacturing exemplifies the importance of invention in advancing technology. His contributions continue to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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